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X9 X9.100-30-2011 (R2017)

M00009335

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X9 X9.100-30-2011 (R2017) Optical Background Measurement for MICR Documents

standard by Accredited Standards Committee X9 Incorporated, 08/09/2011

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ANSI X9.100-30-2011 (R2017) is the specification of the optical measurement methodology for the parameters of reflectance, PCS, DCR, Paxel Count, and opacity which are needed for MICR documents.

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Published: 08/09/2011 ANSI: ANSI Approved Number of Pages: 35 File Size: 1 file , 770 KB