Full Description

This document is an annex to EIA Engineering Bulletin SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace, and other Rugged Applications (the latest revision).

Failure-Mechanism-Driven Reliability Monitoring draws upon the concepts and implementation of line controls, process stability and effective monitoring programs in lieu of qualifying a product based solely on a fixed list of tests. A supplier must identify those failure mechanisms that may be actuated through a given product/process change(s), and design and implement reliability tests adequate to assess the impact of those failure mechanisms on system level reliability. In order for this to be effective, the supplier establishes a thorough understanding and linkage to their reliability monitoring program. Statistical Reliability Monitoring (SRM) is a statistically based methodology for monitoring and improving reliability involving identification and classification of failure mechanisms, development and use of monitors, and investigation of failure kinetics allowing prediction of failure rate at use conditions. Failure kinetics are the characteristics of failure for a given physical failure mechanism, including (where applicable) acceleration factor, derating curve, activation energy, median life, standard deviation, characteristic life, instantaneous failure rate, etc.

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Published: 12/01/1999