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SME EE00-145

M00013337

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SME EE00-145 Optimizing Test Probe Contact For No-Clean Electronic Assemblies

standard by Society of Manufacturing Engineers, 11/01/2000

Bill Barthel ; Nancy Diehl

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This paper reviews the PCB and test fixture design criteria, along with key assembly process parameters that affect test probe contact. Through a series of designed experiments, the significance of these factors are investigated. In conclusion, a set of design and process recommendations are presented that provide optimum test probe contact for solder paste vias with a no-clean process.