M00000624
New product
ASTM F1262M-95 Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
standard by ASTM International, 11/10/1995
In stock
Warning: Last items in stock!
Availability date: 07/24/2021
1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10 Gy (Si)/s.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.