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New Reduced price! ASTM ADJF0576

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ASTM ADJF0576

Reference: M00000541

Condition: New product

ASTM ADJF0576 Adjunct to F576 Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry

DEVICE / CHART by ASTM International,

In stock

Full Description

Graphs for determining refractive index and standard deviation (2)