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BS EN IEC 60749-26:2018
M00000131
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30 April 2018 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
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Semiconductor devices, Electronic equipment and components, Degradation, Sensitivity, Climate, Integrated circuits, Electrostatics, Environmental testing, Human body, Test models, Grades (quality), Mechanical testing, Damage, Electrical testing, Classification systems