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18/30373809 DC
M00000208
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25 April 2018 BS EN 60749-17. Semiconductor devices. Mechanical and climatic test methods. Part 17. Neutron irradiation
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Semiconductor devices, Integrated circuits, Military engineering, Space technology components, Degradation, Neutrons, Destructive testing, Dosimeters, Climate, Electronic equipment and components, Nuclear particles, Military equipment, Irradiation, Radiation measurement, Environmental testing, Mechanical testing