M00001888
New product
28 November 2017 Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)
In stock
Warning: Last items in stock!
Availability date: 07/12/2021
Environmental testing, Semiconductor devices, Integrated circuits, Electronic equipment and components, Climate, Accelerated testing, Mechanical testing, Damp-heat tests