Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
New
Reduced price!
View larger
View larger
17/30352696 DC
M00002952
New product
05 September 2017 BS IEC 62047-31. Semiconductor devices. Micro-electromechanical devices. Part 31. Four-point bending test method for interfacial adhesion energy of layered MEMS materials
In stock
More info
Defects, Optical recording, Testing conditions, Storage, Optical disks, Data recording, Computer storage devices, Data media, Dimensions, Read-only storage, Environment (working), Data processing, Error correction, Data transmission, Recording tracks, Information exchange, Coding (data conversion), Optical properties of materials, Recording characteristics, Digital signals, Data transfer, Data layout, CD-ROM