M00003534
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20 July 2017 BS EN 62047-36. Semiconductor devices. Micro-electromechanical devices. Part 36. Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
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Availability date: 07/12/2021
Terminology, Electronic equipment and components, Electromechanical devices, Semiconductor technology, Integrated circuits, Semiconductor devices, Vocabulary