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BS EN 62435-2:2017
M00003734
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06 July 2017 Electronic components. Long-term storage of electronic semiconductor devices. Deterioration mechanisms
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Identification methods, Colour codes, Measurement, Position, Electric terminals, Ratings, Symbols, Letters (symbols), Terminology, Electronic equipment and components, Integrating circuits, Semiconductor devices, Testing conditions, Reliability, Acceptance (approval), Endurance testing, Electrical measurement, Electrical testing, Electrostatics, Sensitivity, Storage, Marking, Graphic symbols, Labels