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BS EN 62435-5:2017
M00000419
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30 April 2017 Electronic components. Long-term storage of electronic semiconductor devices. Die and wafer devices
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Reliability, Sensitivity, Electrostatics, Acceptance (approval), Endurance testing, Integrated circuits, Electronic equipment and components, Measurement, Electrical testing, Position, Electric terminals, Identification methods, Ratings, Letters (symbols), Marking, Electrical measurement, Graphic symbols, Symbols, Terminology, Labels, Colour codes, Semiconductor devices, Testing conditions, Storage