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BS ISO 22489:2016

M00001899

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31 October 2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

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Chemical analysis and testing, Microanalysis, Electron beams, Spectroscopy, Instrumental methods of analysis, Dispersion (waves), Wavelengths, X-rays, X-ray analysis, Specimen preparation, Test equipment