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BS IEC 60747-10:1991
M00002397
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30 September 1991 Semiconductor devices. Generic specification for discrete devices and integrated circuits
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Semiconductor devices, Integrated circuits, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Marking, Endurance testing, Sampling methods, Accelerated testing, Testing conditions, Capability approval, Documents, Sampling tables, Dimensions, Orientation