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BS ISO 14606:2000

M00000128

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15 January 2001 Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

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Augers, Depth, Electron emission, Microscopic analysis, Control samples, Surface chemistry, Chemical analysis and testing, Laminates, Profile measurement, Mass spectrometry, Spectroscopy, Reference conditions, X-rays, Surface properties, Spectrochemical analysis, Radiation measurement