ISO FDIS 17901-2

Description / Abstract: This part of ISO 17901 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. This part of ISO 17901 does not intend to restrict manufacturing process.