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ISO FDIS 17470
M00018545
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ISO FDIS 17470 2013 Edition, October 4, 2013 MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - GUIDELINES FOR QUALITATIVE POINT ANALYSIS BY WAVELENGTH DISPERSIVE X-RAY SPECTROMETRY
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Description / Abstract: This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.