ISO DIS 20579-1

Description / Abstract: This International Standard gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly: Auger electron spectroscopy (AES), Secondary ion mass spectrometry (SIMS), and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable for other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.